煤浆电解制氢的动力学研究

研究了煤浆电解过程中电压、温度、H₂SO₄浓度、Fe³⁺浓度等因素的影响,并进行了电解前后煤粉样品的热重测试和电解后溶液的成分分析。结果表明,电压、温度、添加的Fe³⁺浓度、H₂SO₄浓度等参数对电解过程的电流密度有较大影响。其中,温度对电流密度的影响符合阿伦尼乌斯方程,在电解电压1 V条件下煤浆电解活化能为31.87 kJ/mol。TGA和ICP分析表明,电解后煤中的部分金属离子溶入溶液,导致结构和灰分成分发生了较显著的变化。     

An Efficient Approach for the Construction of Benzazepine and Benzoxepine Derivatives

A novel and facile synthetic protocol for the construction of benzazepine and benzoxepine derivatives through a copper(I)‐catalyzed reaction of 2‐(2‐ethynylphenyl)‐1‐tosylaziridine or 2‐(2‐ethynylphenyl)oxirane with sulfonyl azides is disclosed. A ketenimine is the key intermediate during the reaction process.     

Biological evaluation of novel selenazole‐based compounds as potential thioredoxin reductase inhibitors

Recently, thioredoxin reductase as a target for treatment of tumors has attracted the attention of scientists. 1,2‐[Bis(1,2‐benzisoselenazolone‐3(2 H)‐ketone)]ethane (ethaselen, BBSKE, PCT: CN02/00412), designed and synthesized previously, is an effective thioredoxin reductase inhibitor; presently it is in phase II clinical trials, targeting gastric cancer, lung cancer and colon cancer. To seek more novel and effective anticancer drugs, we have developed many selenazole‐based compounds. Evaluation of the thioredoxin reductase inhibitory effect and investigation of the mechanism of anticancer drugs require abundant thioredoxin reductase, but since commercial thioredoxin reductase is expensive its use is often limited. Therefore, the preparation of thioredoxin reductase is necessary. Base on the above investigation, in this work we have prepared thioredoxin reductase and evaluated selenazole‐based compounds, and found that 44 compounds have high inhibitory effect on thioredoxin reductase with IC₅₀ < 10 µ m , of which 16 compounds have IC₅₀ values below 1 µ m . This is helpful in investigating and elucidating the mechanism of this kind of compound. Copyright © 2012 John Wiley & Sons, Ltd.     

Normal tracing deflectometry using a secondary light source

Scanning deflectometric profilers based on an f–gθ system are typical optical tools used to measure mirror profiles at many synchrotron facilities. Unlike these profilers, which are based on a pencil beam, here a secondary light source and a pinhole are used to construct a system that automatically selects a beam that will always pass through the pinhole and propagate along the normal direction of the measured area on the surface under test. By measuring the angle variation of the selected beam, slope variations of the surface under test can be measured. Systematic errors introduced by manufacturing defects or aberrations of an optical element, which greatly degrade the performance of traditional profilers, could be minimized by using the developed method. Simulation values of the proposed method and a conventional method are compared.